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Design of a 14-Bit 1 MS/s Successive Approximation Analog-to-Digital Converter

DOI: 10.4236/jpee.2024.1211004, PP. 59-71

Keywords: Analog-to-Digital Converter, Capacitor Mismatch, Calibration, Successive Approximation

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Abstract:

A 14-bit successive approximation analog-to-digital converter (SAR ADC) with capacitive calibration has been designed based on the SMIC. 18 μm CMOS process. The overall architecture is in fully differential form to eliminate the effect caused by common mode noise. Meanwhile, the digital-to-analog converter (DAC) is a two-stage structure, which can greatly reduce the area of the capacitor array compared with the traditional DAC structure. The capacitance calibration module is mainly divided into the mismatch voltage acquisition phase and the calibration code backfill phase, which effectively reduces the impact of the DAC mismatch on the accuracy of the SAR ADC. The design of this paper is based on cadence platform simulation verification, simulation results show that when the sampling rate is 1 MS/s, the power supply voltage is 5 V and the reference voltage is 4.096 V, the effective number of bits (ENOB) of the ADC is 13.49 bit, and the signal-to-noise ratio (SNR) is 83.3 dB.

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