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氮化硅脊波导在弯曲条件下折射率变化特性
Refractive Index Variation Characteristics of Silicon Nitride Rib Waveguide under Bending Condition

DOI: 10.12677/APP.2022.122009, PP. 68-74

Keywords: 氮化硅,脊波导,弯曲波导,有效折射率
Silicon Nitride
, Rib Waveguide, Curved Waveguide, Effective Refractive Index

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Abstract:

本文采用有限–差分方法模拟了绝缘体上氮化硅(Si3N4)脊型弯曲波导的折射率特性。基于弯曲波导的麦克斯韦方程,本文对弯曲波导芯层内折射率随波导半径与结构的变化进行了分析。进而,利用有限–差分算法的软件MODE Solutions的仿真结果表明,在脊型波导结构下,弯曲的波导结构随着弯曲半径的增加导致传输光中心发生偏移,造成TE/TM模式的有效折射率发生变化。该研究对于各波导器件中脊型波导弯曲设计评估具有重要意义。
In this paper, the refractive index characteristics of silicon nitride (Si3N4) bent rib waveguide on Silicon-on-Insulator are simulated by finite-difference method. Based on the Maxwell’s equations of bent waveguides, the refractive index changes of the core with the radius and structure of a bent waveguide are analyzed. Then, our simulation results from the MODE Solutions of the Finite-Difference software show that, for a bent rib waveguide structure, the center of transmitted light shifts with the increase of bending radius, and the effective refractive index of TE/TM mode changes with the increase of bending radius. This research is of great significance for the design and evaluation of various bending rib waveguide devices.

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