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-  2014 

Fabrication and Characterization of Alq3 Thin Films

DOI: https://doi.org/10.17230/ingciencia.10.20.3

Keywords: thin film, thermal evaporation, substrate, characterization, organic semiconductor

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Abstract:

Alq3 (tris (8-hydroxyquinolate) aluminum) thin films were deposited on glass by thermal evaporation in order to establish the optimal evaporation rates of thin films deposited between 30 to 120nm on a substrate with temperatures between 60 and 120°C. The thin films were characterized by SEM microscopy and perfilometry to compare the obtained thickness in-situ by quartz crystals; furthermore photoluminescence measures were made

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