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- 2018
TEM and STEM Studies on the Cross-sectional Morphologies of Dual-/Tri-layer Broadband SiO2 Antireflective FilmsDOI: 10.1186/s11671-018-2442-4 Keywords: Sol–gel process, Antireflective film, TEM, STEM, Density ratio Abstract: a Low-magnification TEM images of silica sol C. b High-magnification TEM images of silica sol C. c Low-magnification TEM images of silica sol D. d High-magnification TEM images of silica sol D. Insets in images are the corresponding grain size distribution histogram and SEAD spectru
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