%0 Journal Article
%T TEM and STEM Studies on the Cross-sectional Morphologies of Dual-/Tri-layer Broadband SiO2 Antireflective Films
%A Dengji Li
%A Hongwei Yan
%A Liang Qiao
%A Shaobo Han
%A Shuangyue Wang
%A Wei Liu
%A Xia Xiang
%A Xiaodong Yuan
%A Xiaotao Zu
%J Archive of "Nanoscale Research Letters".
%D 2018
%R 10.1186/s11671-018-2442-4
%X a Low-magnification TEM images of silica sol C. b High-magnification TEM images of silica sol C. c Low-magnification TEM images of silica sol D. d High-magnification TEM images of silica sol D. Insets in images are the corresponding grain size distribution histogram and SEAD spectru
%K Sol¨Cgel process
%K Antireflective film
%K TEM
%K STEM
%K Density ratio
%U https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5809628/