In Situ High-Pressure X-ray Diffraction and Raman Spectroscopy Study of Ti3C2Tx MXene

a Optical image of ultrasonically exfoliated Ti3C2Tx flakes; b AFM topographic image of ultrasonically exfoliated Ti3C2Tx flakes, and a line profile across the marked dashed line is shown as an inset, indicating the Ti3C2Tx flake thickness of 170 nm; c SEM image of ultrasonically exfoliated Ti3C2Tx flakes; d XRD spectra of Ti3C2Tx raw powde