%0 Journal Article
%T In Situ High-Pressure X-ray Diffraction and Raman Spectroscopy Study of Ti3C2Tx MXene
%A Cheng-Te Lin
%A He Li
%A Jinhong Yu
%A Kaixin Song
%A Li Fu
%A Luxi Zhang
%A Weitao Su
%A Xiwei Huang
%A Yanwei Huang
%J Archive of "Nanoscale Research Letters".
%D 2018
%R 10.1186/s11671-018-2746-4
%X a Optical image of ultrasonically exfoliated Ti3C2Tx flakes; b AFM topographic image of ultrasonically exfoliated Ti3C2Tx flakes, and a line profile across the marked dashed line is shown as an inset, indicating the Ti3C2Tx flake thickness of 170 nm; c SEM image of ultrasonically exfoliated Ti3C2Tx flakes; d XRD spectra of Ti3C2Tx raw powde
%K Ti3C2Tx MXene
%K High-pressure XRD
%K High-pressure Raman
%K Grščneisen parameter
%U https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6206307/