全部 标题 作者
关键词 摘要

OALib Journal期刊
ISSN: 2333-9721
费用:99美元

查看量下载量

相关文章

更多...

溶液温度对电化学沉积氧化亚铜薄膜相成分和显微结构的影响

Keywords: cu_2o,电化学沉积,薄膜

Full-Text   Cite this paper   Add to My Lib

Abstract:

?用电化学方法在不锈钢基体上沉积了多晶cu2o薄膜并用x射线衍射和扫描电镜进行了分析.研究了溶液温度对薄膜相组成、晶粒尺寸和择优取向的影响当溶液的ph=9、温度低于50℃时得到的是cu2o/cu复相薄膜,纯cu2o薄膜可在溶液温度高于50℃时获得纯cu2o薄膜具有(100)择优取向实验发现薄膜的晶粒尺寸随溶液温度的增加从0.12μm增加到0.65μm。

References

[1]  1serezinaa,weichmanfl.solidstatecommun,1981,37:1572drobnyvf,pulfreydl.thinsolidfilms,1979,61:893ristovm,sinadinovskig,mitreskim.thinsolidfilms,1985,123:634rakhshaniae,varghesej.thinsolidfilms,1988,157:875mukhopadhyayak,chakrabrtyak,chattericeap,lahrisk.thinsolidfilms,1992,209:926coylert,switzerja.u.spatent4,882,014,issuednov,19897switzerja.amceramsocbull,1987,66:15218switzerja,shanemj,phillipsrj.science,1990,247:4469goldentd,raffaellerp,switzerja.applphyslett,1993,63:150110switzerja,hungcj,breyfolebeetal.goldenscience,1994.264:157311chatterjeeap,mukhopadhyayak,chakrabortyaketal.materialsletters,1991,11:35812rakhshaniae,varghesej.physstatsol(a).1988,105:18313donnayjdh,harkerd.ammineralogist1937,22:44614wellsaf,philmag,1946,37:18415berkovitch-yellinz.jamchemsoc,1985.107:823916zhouyc.postdoctoralworkatuniversityofmissouri-rolla,1994`

Full-Text

Contact Us

service@oalib.com

QQ:3279437679

WhatsApp +8615387084133