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OALib Journal期刊
ISSN: 2333-9721
费用：99美元
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环氧树脂的飞行时间次级离子质谱仪(tof—sims)分析
Keywords: 飞行时间次级离子质谱,环氧树脂,银离化
Abstract:
？用飞行时间次级离子质谱仪(tof—sims)结合银离化技术,研究了两种型号的环氧树脂;发现了一些不同结构的成分,指出了其可能的结构提出了一种测量环氧端基水解率的方法
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