OALib Journal期刊
ISSN: 2333-9721
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二次烧成对caob2o3sio2系微晶玻璃结构和性能的影响
, PP. 11-15
Keywords: 二次烧成,钙硼硅玻璃,性能
Abstract:
摘要:研究一次和二次烧成对caob2o3sio2(cbs)微晶玻璃的烧结性能与介电性能的影响。用x线衍射(xrd)、扫描电镜(sem)等分析探讨二次烧成对cbs微晶玻璃的微观结构与介电性能的关系。结果表明:与一次烧成相比,二次烧成能够促进玻璃体中的小晶粒生长,试样的收缩率和体积密度有所增加,有利于介电常数提高和介质损耗的降低,且体系中没有出现新的晶相;875℃烧结的试样,x/y轴收缩率均为14.33%,体积密度达到2.46g/cm3,10mhz介电常数和损耗相应为6.21和3.5×10-3,热膨胀系数为11.86×10-6/℃,抗折强度为157.36mpa。
References
[1] | 向勇,谢道华.片式多层元件新技术概论[j].电子元件与材料,1999,18(4):34-40.
|
[2] | hsujy,linhc,shenhd,etal.highfrequencymultilayerchipinductors[j].ieeetransactionsonmagnetics,1997,33(5):3325-3327.
|
[3] | jeanjh,changcr,leicd.sinteringofacrystallizablecao-b2o3-sio2glasswithsilver[j].jamceramsoc,2004,71:1245-1249.
|
[4] | hanmannhs.crystallizable,lowdielectricconstant,lowdielectric,losscomposition:us,5024975[p].1991-06-18.
|
[5] | wangsh,zhouhp.densificationanddielectricpropertiesofcao-b2o3-sio2systemglassceramics[j].matersciengb,2003,99(1/2/3):597-600.
|
[6] | shapiroaa,mecartneyml,leehp.acomparisonofmicrostripmodelstolowtemperatureco-firedceramic-silvermicro-stripmeasurements[j].microelectronicsjournal,2002,33:443-447.
|
[7] | chiangcc,wangsf,wangyr,etal.characterizationsofcao-b2o3-sio2glass-ceramics:thermalandelectricalproperties[j].journalofalloysandcompounds,2007,24:1-5.
|
[8] | zhuhk,lium,zhouhq,etal.studyonpropertiesofcao-b2o3-sio2systemglass-ceramic[j].materialsresearchbulletin,2007,42:1137-1144.
|
[9] | 崔学民,邱树恒,童张法,等.baotio2b2o3sio2体系ltcc介电性能的研究[j].功能材料,2007,38(6):934-937.
|
[10] | pennsj,alfordnm,templetona,etal.effectofporosityandgrainsizeonthemicrowavedielectricpropertiesofsinteredalumina[j].jamceramsoc,1997,80(7):1885-1888.
|
[11] | 关振铎,张中太,焦金生.无机材料物理性能[m].北京:清华大学出版社,2000.
|
[12] | 王少洪,周和平,乔梁.caob2o3sio2系微晶玻璃的低温烧结机理[j].硅酸盐通报,2002(3):1-6.
|
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