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含能材料  2012 

半导体桥静电作用前后点火特性

DOI: 10.3969/j.issn.1006-9941.2012.01.024

Keywords: 军事化学与烟火技术,半导体桥,静电放电,烧蚀面积,电容放电,t检验

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Abstract:

对静电作用过的半导体桥和未经受静电作用的半导体桥进行D-最优化点火实验,得到全发火电压,并在全发火电压下点火,用示波器采集电压、电流以及发火时间等信号,用显微镜观察桥面的烧蚀情况并计算烧蚀面积。分析得到:静电对半导体桥的桥膜产生了损伤,静电电压越大,烧蚀面积越大;经过静电作用的桥与未静电作用的桥相比,全发火电压降低,发火能量减小,桥变得更加敏感。对全发火电压下的发火能量和发火时间进行t检验,得到21kV是临界值,静电电压大于21kV,静电对桥的性能影响明显;小于21kV,静电对桥的影响不大。

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