全部 标题 作者
关键词 摘要

OALib Journal期刊
ISSN: 2333-9721
费用:99美元

查看量下载量

相关文章

更多...

不同结构的碲镉汞长波光伏探测器的暗电流研究

Keywords: 光伏探测器暗电流碲镉汞材料异质结分子束外延技术铟掺杂红外探测器

Full-Text   Cite this paper   Add to My Lib

Abstract:

摘要对B^注入的n-on-p平面结和分子束外延(MBE)技术原位铟掺杂的n-on-p台面异质结的碲镉汞(HgCdTe)长波光伏探测器暗电流进行了对比分析.与n-on-p平面结器件相比,原位掺杂的n-on-p台面异质结器件得到较高的零偏动态阻抗一面积值(RoA).通过与实验数据拟合,从理论上计算了这两种结构的器件在不同温度下的RoA和在不同偏压下的暗电流,得到一些相关的材料和器件性能参数.

References

[1]  【1】全知觉,李志锋,胡伟达,叶振华,陆卫, "光伏型碲镉汞长波探测器暗电流特性的参数提取研究",红外与毫米波学报 26, 92-96(2007)
[2]  【2】孙涛,梁晋穗,陈兴国,胡晓宁,李言谨, "Hg1-xCdxTe长波光伏探测器的低频噪声研究",红外与毫米波学报 24, 273-276(2005)
[3]  【3】何力,胡晓宁,丁瑞军,李言谨,杨建荣,张勤耀, "第三代红外焦平面基础技术的研究进展",红外与激光工程 36, 696-701(2007)
[4]  【4】叶振华,吴俊,胡晓宁,巫艳,王建新,李言谨,何力, "碲镉汞p+-on-n长波异质结探测器的研究",红外与毫米波学报 23, 423-426(2004)
[5]  【1】Glenn T Hess, Thomas J Sanders. HgCdTe double layer heterojuction detector device [J]. SPIE, 2000, 4028:353-364
[6]  【2】Wenus J, Rutkowski, Rogalski A. Two-dimensional analysis of double-layer heterojunction HgCdTe photodiodes [J].SPIE, 2001, 4288:335-344
[7]  【3】Antoni Rogalski. Heterostructure HgCdTe photovoltaic detectors[J]. SPIE, 2001, 4355:1-14
[8]  【4】Rogalski A. Photovoltaic Detector in Infrared Photon Detectors [M]. USA: Washington, SPIE Optical Engineering Press, 1996, chap. 3
[9]  【5】Nemirovsky Y, Rosenfeld D, Adar R, et al. Tunneling and dark currents in HgCdTe photodiodes [J]. J. Vac. Sci.Technol. , 1989, A7(2): 528-535
[10]  【6】Kinch M A, Willardson R K, Beer A C. Metal Insulator Semiconductor Detectors in Semiconductors and Semimetals[M]. New York: Academic Press, 1981, 18(6)
[11]  【7】David Rosenfeld, Gad Bahir. A model for the trap-assisted tunneling mechanism in diffused n-p and implanted n + -p HgCdTe photodiodes [J]. IEEE Transactions on Electron Devices, 1992, 39(7): 1638-1645
[12]  【8】Dhar V, Ashokan R, Khan Z A D, et al. Analysis of the R0A product in n+ and n+-n-p Hg1-x CdxTe photodiodes[J]. Semicond. Sci. Technol. , 1996, 11:1077-1084
[13]  【9】Adar R. Spatial integration of direct band-to-band tunneling currents in general device structures[J]. IEEE Transactions on Electron Devices, 1992, 39(4): 976-981
[14]  【10】Dewames R E, Williams G M, Pasko J G, et al. Current generation mechanisms in small band Gap HgCdTe-p-n junctions fabricated by ion implantation [ J ]. Journal of Crystal Growth, 1988, 86:849-858
[15]  【11】Rogalski A. Infrared Detectors [M]. UK: Norwich, 2000,chap. 8

Full-Text

Contact Us

service@oalib.com

QQ:3279437679

WhatsApp +8615387084133