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核技术  2015 

基于蒙特卡罗方法的XRF探测器立体角分析

DOI: 10.11889/j.0253-3219.2015.hjs.38.060502, PP. 60502-60502

Keywords: 探测器立体角,X荧光分析,蒙特卡罗方法,拟合优度

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Abstract:

为研究探测器立体角在X射线荧光(X-rayfluorescence,XRF)分析仪的设计对测量结果的影响,运用蒙特卡罗方法对XRF仪进行建模。结果表明,探测器脉冲计数随着探测器与样品之间距离的增大指数衰减;随着探测器立体角的增大,特征峰计数非线性增大,源峰探测效率指数递减;探测器本征探测效率与探测器立体角无关。本文研究方法和结论可为一些XRF仪的设计提供参考。

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