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材料工程  2005 

Ge1-xCx薄膜的制备及红外特性的研究

, PP. 53-57

Keywords: Ge1-xCx薄膜,PECVD,红外特性,沉积速率

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Abstract:

利用等离子体化学气相沉积(PECVD)法制备出Ge1-xCx薄膜,并系统地研究了工艺参数对薄膜成分的影响,以及不同组分Ge1-xCx薄膜的红外光学特性。结果表明,薄膜中的C含量随着CH4/GeH4气体流量比的增大而增大;薄膜的红外折射率随组分的不同在2~4范围内变化;薄膜的沉积速率随射频功率增大而增大,但当功率达到60W以后其变化不明显;沉积速率随温度的增加而减少;该薄膜具有透长波红外的性能。

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