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OALib Journal期刊
ISSN: 2333-9721
费用：99美元
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单晶材料断口结晶学小面的取向测定方法
, PP. 23-25
Abstract:
本文论述了用X射线衍射仪和扫描电子显微镜对单晶材料断口结晶学小面的取向进行测定的方法,即图象测量标定法.
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| [2] | Piazzesi, G., photogrammetry witb the SEM, J.phys.(E),1973, VoI.6, PP392~396.
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| [3] | Wart, J. A., and Robertson, Determination of Crystallographic Facet Orientation on Fracture surfaces, Metallograph, 1982,15-4,PP367~381.
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