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单量子阱InGaN/GaN势垒高度与LED光电性能关系研究

, PP. 107-115

Keywords: 光电子学,量子阱垒高,In含量,数值模拟,InGaN/GaN发光二极管

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Abstract:

通过对InxGa1-xN掺杂不同组份的In来改变InxGa1-xN的禁带宽度,从而改变量子阱势垒高度,并研究其与发光二极管光电性能、效率下降之间的关系。通过仿真模拟实验研究了不同量子阱势垒高度与InGaN/GaN量子阱发光二极管的功率光谱密度、内量子效率、发光功率及复合率之间的关系。分析结果表明(1)In含量与发光二极管的光电性能并非成线性关系。(2)在电流密度较低时,In组份越小,光谱密度峰值越大,发光功率越大。(3)在电流密度较大时,In组份越大,光谱密度峰值越大,发光功率越大。(4)光谱蓝移与电流密度大小紧密相关,电流密度大的蓝移程度大,反之越小。因此,应该根据不同的电流密度来选择In组份的大小,从而提高发光效率。

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