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基于序进应力加速试验评价器件寿命的方法

Keywords: 寿命试验,激活能,可靠性

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Abstract:

基于对序进应力加速寿命试验的研究,提出了一种快速确定半导体器件寿命的方法,建立了理论模型.以样品3CG120为例,进行了175~345℃范围内的序进应力加速寿命试验,快速提取样品的失效敏感参数hFE的退化量与温度的关系,得到了样品的hFE的温度特性和退化特性,并根据模型计算得到器件的失效激活能和寿命.结果与文献能很好地吻合,验证了该方法的可行性.

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