OALib Journal期刊
ISSN: 2333-9721
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离子注入Cu薄膜的氧化行为研究
, PP. 1187-1191
Keywords: Cu薄膜,离子注入,Cr,氧化
Abstract:
研究了用强流金属蒸汽弧离子源(MEVVA源)注入Cr对Cu薄膜的抗氧化性能、导电性能和氧化特征的影响.利用X射线衍射、Rutherford背散射和扫描电镜离子注入前后氧化物结构和氧化物形态演变.结果表明,在薄膜的表面层注入一定剂量的Cr能有效地改善Cu薄膜的抗氧化性能,而对薄膜的电导性能无显著影响;离子注入显著影响薄膜表面氧化铜的结构和形态.探讨了离子注入对氧化铜结构和形态的影响机理.
References
[1] | Li J, Blewer R, Mayer J W. MRS Bull, 1993; 18: 18
|
[2] | Harper J M E, Colgan E G, Hu C-K, Hummel J P, Buchwalter L P, Uzoh C E. MRS Bull, 1994; 19: 23
|
[3] | Li J, Seidel T E, Mayer J W. MRS Bull, 1994; 19: 15
|
[4] | Wang S Q, Suter S, Hoeflich C, Burrow B J. J Appl Phys,1993; 73: 2301
|
[5] | LLi J, Mayer J W, Colgan E G. J Appl Phys, 1991; 70:2820
|
[6] | Ding P J, Lanford W A, Hymes S, Murarka S P. J ApplPhys, 1994; 75: 3627
|
[7] | Ding P J, Lanford W A, Hymes S, Murarka S P. ApplPhys Lett, 1994; 65: 1778
|
[8] | Lanford W A, Ding P J, Wang W, Hymes S, Murarka SP. Thin Solid Films, 1995; 262: 235
|
[9] | Li J, Mayer J W, Diamand Y S, Colgan E G. Appl PhtsLett, 1992; 60: 2986
|
[10] | Adams D, Alford T L, Theodore N D, Russell S W, Spre-itzer R L, Mayer J W. Thin Solid Films, 1995; 262: 199
|
[11] | Li J, Mayer J W. MRS Bull, 1993; 18: 52
|
[12] | Ziegler J F, Biersack J P, Littmark U. The Stopping andRange of Ions in Solids. New York: Pergamon, 1985: 49
|
[13] | de Boer F R, Boom R, Mattens W C M, Miedema A R,Niessen A K. Cohesion in Metals. Netherlands: North-Holland Physics Press, 1988: 167
|
[14] | Hauffe K. Oxidation of Metals. New York: Plenum, 1965:159
|
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