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OALib Journal期刊
ISSN: 2333-9721
费用：99美元
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CoSi2薄膜二维X射线衍射线形分析与表征
, PP. 487-490
Keywords: CoSi2,薄膜材料,二维X射线衍射
Abstract:
利用二维X射线衍射线形分析方法，分析了CoSi2薄膜材料的二维衍射线形。结果表明，薄膜中不同方位的衍射线形存在明显差异，主要与材料中晶粒尺寸及显微畸变的空间分布有关，其中沿薄膜法线方向上的晶粒尺寸最大，同时该方向的显微畸变最小。
| [1] | Murarka S P. Intermetallics, 1995; 3: 173
|
| [2] | Jyh-Hua T, Shiuann-Huah S, Yeong-Jyh C. Thin Solid Films, 2004; 468(1-2): 155
|
| [3] | Knuyt G, Quaeyhaegens C, Haen J D, Stals L M. Surface & Coatings Technology, 1995; 76-77: 311
|
| [4] | Zhou Z F, Fan Y D. Thin Solid Films, 1994; 239: 1
|
| [5] | Perlovich Y, Isaenkova M. Mater Sci Forum, 2004; 443- 444: 255
|
| [6] | Wenge Y, Cargill G S, Moyer L, Larson B C. Mater Sci Forum, 2003; 426-432: 3945
|
| [7] | Itoh K, Okamoto K, Hashimoto T, Fujiwara H. J Magn Magn Mater, 1990; 86: 247
|
| [8] | Hara K, Itoh K, Okamoto K, Hashimoto T. J Magn Magn Mater, 1996; 162: 177
|
| [9] | Hsieh J H, Li C, Wu W, Hochman R F. Thin Solid Films, 2003; 424: 103
|
| [10] | Karunagaran B, Rajendra R T, Mangalaraj D, Narayan dass S K, Mohan G M. Cryst Res Technol, 2002; 37: 1285R
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