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OALib Journal期刊
ISSN: 2333-9721
费用：99美元
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Cu/Cu(Ge,Zr)/SiO2/Si多层膜界面可控反应及热稳定性研究
DOI: 0.3724/SP.J.1037.2013.00284, PP. 1264-1268
Keywords: Cu(Ge,Zr)薄膜,界面反应,选择性自反应,热稳定性
Abstract:
利用多靶磁控溅射技术在SiO2/Si基体上沉积Cu/Cu(Ge,Zr)多层薄膜,采用四探针仪(FPPT),X射线衍射仪(XRD),高分辨透射电镜(HRTEM),X射线光电子能谱(XPS)和原位纳米电子束探针能谱(EDS)表征多层薄膜退火前后电阻率、微观结构和界面成分的演变及行为.结果表明,在低温退火阶段(450℃),Zr原子在Cu3Ge/SiO2界面析出并与SiO2层进一步反应形成稳定非晶ZrOx/ZrSiyOx化合物.Cu(Ge,Zr)薄膜中异质原子及与相邻膜层间分步选择性自反应合成高热稳Cu3Ge/ZrOx/ZrSiyOx复合阻挡层,使Cu/Cu(Ge,Zr)/SiO2/Si多层膜具有高热稳定性.
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