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D4含量对硅橡胶微观结构和憎水恢复的影响

DOI: 10.13334/j.0258-8013.pcsee.2015.08.032, PP. 2097-2104

Keywords: 憎水恢复性,硅橡胶,八甲基环4硅氧烷(D4),正电子寿命谱,自由体积,Ar等离子体

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Abstract:

憎水恢复性是硅橡胶的重要特性,其恢复速度对电力系统用硅橡胶复合绝缘子至关重要。为研究小分子含量对硅橡胶微观结构和憎水恢复的影响,炼制八甲基环4硅氧烷(D4)质量分数含量分别为0,1,2,3,5phr(生胶的含量为100phr)的硅橡胶试片,对其进行正电子寿命谱检测,探讨D4含量的不同对硅橡胶结构的影响。对试样进行Ar等离子体处理,测量其憎水恢复速度,研究D4含量对硅橡胶憎水恢复的影响。结果表明,未加D4的硅橡胶试片中存在两种不同孔径的自由体积,对应半径分别为2.12?的小孔和4.05?的大孔。小分子D4含量增加,小孔尺寸(τ3)减小,对应的强度(I3)增加。大孔的尺寸(τ4)及强度(I4)不受D4含量影响。经过Ar等离子体5min处理后,D4含量越多则憎水恢复速度越快。小分子的含量影响硅橡胶憎水恢复速度。

References

[1]  赵锋,张福增,杨皓麟,等.复合绝缘子憎水性及直流污闪特性的影响因素[J].中国电机工程学报,2009,29(1):107-112. Zhao Feng,Zhang Fuzeng,Yang Haolin,et al.Influence factors of hydrophobicity and DC flashover performance for composite insulators[J].Proceedings of the CSEE,2009,29(1):107-112(in Chinese).
[2]  屠幼萍,罗梅馨,应高峰,等.硅橡胶电晕老化热刺激电流特性的正交试验研究[J].中国电机工程学报,2012,32(7):139-144. Tu Youping,Luo Meixin,Ying Gaofeng,et al.Research on TSC characteristics of corona aging of silicone rubber with orthogonal test method[J].Proceedings of the CSEE,2012,32(7):139-144(in Chinese).
[3]  梁曦东,李震宇,周远翔.交流电晕对硅橡胶材料憎水性的影响[J].中国电机工程学报,2007,27(27):19-23. Liang Xidong,Li Zhenyu,Zhou Yuanxiang.Influences of AC corona on hydrophobicity of silicone rubber [J].Proceedings of the CSEE,2007,27(27):19-23(in Chinese).
[4]  Fernando M A R M,Gubanski S M.Ageing of silicone rubber insulators in coastal and inland tropical environment[J].IEEE Transaction on Dielectrics and Electrical Insulation,2010,17(2):326-333.
[5]  Xiong Y,Rowland S M,Robertson J,et al.Surface analysis of asymmetrically aged 400 kV silicone rubber composite insulators[J].IEEE Transaction on Dielectrics and Electrical Insulation,2008,15(3):763-770.
[6]  王少阶,陈志权,王波,等.应用正电子谱学[M].武汉:湖北科学技术出版社,2008:3-6. Wang Shaojie,Chen Zhiquan,Wang Bo,et al.Applied positron spectroscopy[M].Wuhan:Hubei Science and Technology Press,2008:3-6(in Chinese).
[7]  Jean Y C,Hongmin Chen,Zhang R,et al.Early stage of deterioration in polymeric coatings detected by positron annihilation spectroscopy[J].Progress in Organic Coatings,2005,52(1):1-8.
[8]  Mallon P E,Greyling C J,Vosloo W,et al.Positron annihilation spectroscopy study of high-voltage polydimethylsiloxane(PDMS) insulators[J].Radiation Physics and Chemistry,2003,68(3):453-456.
[9]  He CQ , Suzuki T, Hamada E, et al.Characterization of polymer films using a slow positron beam[J].Materials Research Innovations,2003,7(1):37-41.
[10]  Liao K S,Chen H M,Awad S,et al.Determination of free-volume properties in polymers without orthopositronium components in positron annihilation lifetime spectroscopy[J].Macromolecules,2011,44(17):6818-6826.
[11]  Dirac P A M.On the annihilation of electrons and protons[J].Proceedings of Cambridge Philosopy Society,1930(26):361.
[12]  Mogensen O E.Spur reaction model of positronium formation[J].The Journal of Chemical Physics,2003,60(3):998-1004.
[13]  Eldrup M,Lightbody D,Sherwood J N.The temperature dependence of positron lifetimes in solid pivalic acid [J].Chemical Physics,1981,63(1):51-58.
[14]  Dreiss C A,Cosgrove T,Benton N J,et al.Effect of crosslinking on the mobility of PDMS filled with polysilicate nanoparticles:Positron lifetime,rheology and NMR relaxation studies[J].Polymer,2007,48(15):4419-4428.
[15]  Aranguren M I.Crystallization of polydimethylsiloxane:effect of silica filler and curing[J].Polymer,1998,39(20):4897-4903.
[16]  Choudalakis G,Gotsis A D.Free volume and mass transport in polymer nanocomposites[J].Current Opinion in Colloid & Interface Science,2012,17(3):132-140.
[17]  Elbuzedi M.Material study and properties of polymers used in composite high voltage insulators [D].Stellenbosch:Stellenbosch University,2007.
[18]  Kumagai S,Yoshimura N.Tracking and erosion of HTV silicone rubber and suppression mechanism of ATH [J].Dielectrics and Electrical Insulation,IEEE Transactions on,2001,8(2):203-211.
[19]  Meincken M,Berhane T A,Mallon P E.Tracking the hydrophobicity recovery of PDMS compounds using the adhesive force determined by AFM force distance measurements[J].Polymer,2005,46(1):203-208.
[20]  Rowland S M,Robertson J,Xiong Y,et al.Electrical and material characterization of field-aged 400kv silicone rubber composite insulators[J].IEEE Transaction on Dielectrics and Electrical Insulation,2010,17(2):375-383.
[21]  关志成,彭功茂,王黎明,等.复合绝缘子的应用及关键技术研究[J].高电压技术,2011,37(3):513-519. Guan Zhicheng,Peng Gongmao,Wang Liming,et al.Application and key technical study of composite insulators[J].High Voltage Engineering,2011,37(3):513-519(in Chinese).
[22]  贾志东,关志成.室温硫化硅橡胶涂层憎水性迁移机理的研究[J].高电压技术,1999,25(1):7-9. Jia Zhidong,Guan Zhicheng.A study on the hydrophobicity migration of the room temperature vulcanized silicone rubber coating[J].High Voltage Engineering,1999,25(1):7-9(in Chinese).
[23]  Hillborg H,Gedde U W.Hydrophobicity changes in silicone rubbers[J].Dielectrics and Electrical Insulation,IEEE Transactions on,1999,6(5):703-717.
[24]  Homma H,Kuroyagi T,Izumi K,et al.Diffusion of low molecular weight siloxane from bulk to surface [J].Dielectrics and Electrical Insulation,IEEE Transactions on,1999,6(3):370-375.
[25]  Meincken M,Berhane T A,Mallon P E.Tracking the hydrophobicity recovery of PDMS compounds using the adhesive force determined by AFM force distance measurements[J].Polymer,2005,46(1):203-208.
[26]  Venkatesulu B,Thomas M J.Corona aging studies on silicone rubber nanocomposites[J].Dielectrics and Electrical Insulation,IEEE Transactions on,2010,17(2):625-634.
[27]  Zhu Y,Haji K,Otsubo M,et al.Surface degradation of silicone rubber exposed to corona discharge[J].Plasma Science,IEEE Transactions on,2006,34(4):1094-1098.
[28]  Zhu Y,Otsubo M,Honda C,et al.Loss and recovery in hydrophobicity of silicone rubber exposed to corona discharge[J].Polymer degradation and stability,2006,91(7):1448-1454.
[29]  Liang Y,Li C,Ding L,et al.Effect of corona discharge on the hydrophobicity recovery of HTV silicone rubber [J].High Voltage Engineering,2008,34(1):30-32.
[30]  Zhu Y,Otsubo M,Honda C.Degradation of polymeric materials exposed to corona discharges[J].Polymer testing,2006,25(3):313-317.
[31]  Hillborg H,Tomczak N,Olàh A,et al.Nanoscale hydrophobic recovery:A chemical force microscopy study of UV/ozone-treated cross-linked poly(dimethylsiloxane) [J].Langmuir,2004,20(3):785-794.
[32]  Béfahy S,Lipnik P,Pardoen T,et al.Thickness and elastic modulus of plasma treated PDMS silica-like surface layer[J].Langmuir,2009,26(5):3372-3375.
[33]  Bodas D,Rauch J Y,Khan-Malek C.Surface modification and aging studies of addition-curing silicone rubbers by oxygen plasma[J].European Polymer Journal,2008,44(7):2130-2139.
[34]  傅观君,王黎明,候镭,等.±800kV特高压直流耐张串应用复合绝缘子的可行性[J].中国电机工程学报,2011,31(22):119-125. Fu Guanjun,Wang Liming,Hou Lei,et al.Feasibility of application of composite insulators in ±800kV UHV DC tension strings[J].Proceedings of the CSEE,2011,31(22):119-125(in Chinese).
[35]  Flamm D L,Auciello O.Plasma deposition,treatment,and etching of polymers:the treatment and etching of polymers[M].Pittsburgh:Academic Press,2012:50-60.
[36]  Plasma polymer films[M].London:Imperial College Press,2004:15-20.
[37]  Dai L,StJohn H A W,Bi J,et al.Biomedical coatings by the covalent immobilization of polysaccharides onto gas-plasma-activated polymer surfaces[J].Surface and Interface Analysis,2000,29(1):46-55.
[38]  Coulson S R,Woodward I S,Badyal J P S,et al.Ultralow surface energy plasma polymer films[J].Chemistry of Materials,2000,12(7):2031-2038.

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