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碳化硅MOSFET的变温度参数建模

, PP. 37-43

Keywords: 碳化硅MOSFET,变温度参数,PSpice建模,Buck变换器

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Abstract:

为在全温度范围内准确反映碳化硅(siliconcarbide,SiC)MOSFET的工作特性,提出一种基于Pspice仿真软件的SiCMOSFET变温度参数模型。该模型中引入温控电压源和温控电流源以补偿SiCMOSFET静态特性随温度的变化,同时着重考虑了SiCMOSFET的低温特性和驱动电路负压的影响。详细阐述建模原理,分析各个关键参数对SiCMOSFET静态特性及动态特性的影响,给出建模原理。搭建基于Buck变换器的SiCMOSFET测试实验样机,在不同电压点、电流点及温度点(?25~125℃)下进行实验测试,并将测试结果与基于变温度参数Pspice模型的仿真波形和损耗估算结果进行比较。比较结果高度吻合,功率损耗误差在10%以内,验证了提出的变温度参数模型的准确性和有效性,为实际应用中采用SiCMOSFET器件进行系统分析和效率评估提供了重要的依据。

References

[1]  邓夷,赵争鸣,袁立强,等. 适用于复杂电路分析的IGBT模型[J]. 中国电机工程学报, 2010,30(9):1-7. Dengyi,Zhao Zhengming,Yuan Liqiang,et al.IGBT model for analysis of complicated circuits[J].Proceedings of the CSEE,2010,30(9)
[2]  Ryu S H,Agarwal A,Richmond J,et al. Large-area (3.3 mmΧ3.3 mm) power MOSFETs in 4H-SiC [J]. Materials Science Forum, 2002(389-393):1195-1198.
[3]  Ryu S H,Krishnaswami S,O?Loughlin M,et al. 10-kV,123-mΩ?cm2 4H-SiC power DMOSFETs[J]. IEEE Electron Device Lett, 2004,25(8):556-558.
[4]  Ryu S H,Krishnaswami S,Hull B,et al. 10 kV,5A 4H-SiC power DMOSFET[C]//Power Semiconductor Devices and IC's. Durham, NC,USA,2006:1-4.
[5]  Casady J B,Johnson R W. Status of silicon carbide (SiC) as a wide-bandgap semiconductor for high-temperature application:A review[J]. Solid State Electronics, 1999,39(10):1409-1422.
[6]  Duong T H,Berning D W,Hefner A R,et al. Long-term stability test system for high-voltage,high-frequency SiC power devices[C]//Proceedings of the 2007 IEEE Applied Power Electronics Conference. Anaheim, CA:IEEE,2007:1240-1246.
[7]  Agarwal A,Das M,Hull B,et al. Progress in Silicon Carbide power devices[C]//64th Device Research Conference. PA, USA,2006:155-158.
[8]  Agarwal A,Richmond J,Ryu S H,et al. Latest advances in SiC device technology and practical applications[C]// Government Microcircuit Applications and Critical Technology Conference. Monterey, California:Department of Defense of USA,2004:843-846.
[9]  ?stling M,Koo S M,Lee S K,et al. SiC device technology for high voltage and RF power applications [C]//IEEE International Conference on Microelectronics. Yugoslavia:IEEE, 2002,23(1):31-39.
[10]  Agarwal A,Powell A,Sumakeris J,et al. Recent developments in SiC materials and power devices at Cree-a progress report[C]//Government Microcircuit Applications and Critical Technology Conference. Tampa, Florida,Department of Defense of USA,2003:913-917.
[11]  Callanan R J,Agarwal A,Burk A,et al. Recent progress in SiC DMOSFETs and JBS diodes at Cree[C]//34th Annual Conference of IEEE Industrial Electronics. Orlando, USA:IEEE,2008:2885-2890.
[12]  Potbhare S,Goldsman N,Lelis A,et al. A physical model of high temperature 4H-SiC MOSFETs[J]. IEEE Electron Devices, 2008,55(8):2029-2039.
[13]  李庆华,韩郑生,海潮和. MOSFET模型及参数提取[J]. 微电子技术, 2003,31(4):23-28. Li Qinghua,Han Zhengsheng,Hai Chaohe.MOSFET models and parameter extraction[J].Microelectronic Technology,2003,31(4)
[14]  Hasanuzzanman M,Islam S K,Alam M T. Parameter extraction and SPICE model development for 4H-silicon carbide (SiC) power MOSFET[C]//IEEE International Semiconductor Device Research Symposium. Bethesda, MD:IEEE,2005:292-293.
[15]  Aubard L,Verneau G,Crebier J C,et al. Power MOSFET switching waveforms:an empirical model based on a physical analysis of charge locations[C]//IEEE Power Electronics Specialists Conference. IEEE, 2002:1305-1310.
[16]  Budihardjo I,Lauritzen P O,Mantooth H A. Performance requirements for power MOSFET models[J]. IEEE Trans. on Power Electronics, 1997,12(1):36-45.
[17]  Zheng Chen. Characterization and modeling of high switching speed behavior of SiC active devices[D]. MsD:Polytechnic Institute and State University, 2009.
[18]  严杰,王莉,王志强. 基于Matlab的功率MOSFET建模[J]. 电力电子技术, 2005,39(3):23-25. Yanjie,Wang Li,Wang Zhiqiang.Modeling of power MOSFET based on Matlab[J].Power Electronics,2005,39(3)
[19]  Wang J,Zhao T,Li J,et al. Characterization,modeling and application of 10 kV SiC MOSFET[J]. IEEE Trans. on Electron Devices, 2008,55(8):1798-1805.
[20]  Cui Yutian,Chinthavali M,Tolbert L M. Temperature dependent Pspice model of silicon carbide power MOSFET[C]//Applied Power Electronics Conference and Exposition. IEEE, 2012:1698-1704.
[21]  Fu Ruiyun,Grekov A,Hudgins J. et al. Power SiC DMOSFET model accounting for nonuniform current distribution in JFET region[J].IEEE Transactions on Industry Applications, 2012,48(1):181-190.
[22]  Mirzaee H,Bhattacharya S,Ryu S H,et al. Design comparison of 6.5 kV Si-IGBT,6.5kV SiC JBS diode,and 10 kV SiC MOSFETs in megawatt converters for shipboard power system[C]//Electric Ship Technologies Symposium. IEEE, 2011:248-253.
[23]  Hideaki F. A resonant gate-drive circuit capable of high-Frequency and high-Efficiency operation[J]. IEEE Transactions on Power Electronics, 2010,25(4):962.
[24]  赵雅兴. PSpice与电子器件模型[M]. 北京:北京邮电大学出版社, 2004:154-181. Zhao Yaxing.Pspice and electronic devices? model [M].Beijing:BeijingUniversity of Posts and Telecommunications Press,2004
[25]  Leonardi C,Raciti A. A new PSPICE power MOSFET model with temperature dependent parameters:evaluation of performances and comparison with available models [C]//Industry Application Society Annual Meeting. New Orleans, LA:IEEE,1997:1174-1181.
[26]  Cree,Inc. CMF20120D-Silicon carbide power MOSFET datasheet[EB/OL]. [2012-12-.www.cree.com/power.,
[27]  Dolny G M,Ronan J H R,Wheatley J C F. A spice ii subcircuit representation for power mosfets using empirical methods[J]. Radio Corporation of America 1985:308-320.,

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