4 Rastogi AC, Sharma RN. Interfacial charge trapping in ex-trinsic Y2O3/SiO2 bilayer gate dielectric based MIS deviceson Si(100). Semiconductor Science and Technology, 2001, 16(8): 641-650
[2]
5 Tran MD, Poublan J, Dautzenberg JH. A practical methodfor the determination of the Young's modulus and residualstresses of PVD thin films. Thin Solid Films, 1997, 308:310-314
7 He MY, Evans AG, Yehle A. Criterion for the avoidance ofedge cracking in layered systems. Journal of the AmericanCeramic Society, 2004, 87(7): 1418-1423
14 Townsend PH, Barnett DM, Brunner TA. Elastic relation-ships in layered composite media with approximation forthe case of thin films on a thick substrate. Journal of Ap-plied Physics, 1987, 62(11): 4438-4444
[12]
15 Klein CA, Gentilman RL. Thermal shock resistance of con-vectively heated infrared windows and domes. SPIE 3060, Orlando, USA, 1997
[13]
1 Gore G. On the properties of electro-deposited antimony.Philosophical Transactions of the Royal Society of London, 1858, 148: 185-197
