全部 标题 作者
关键词 摘要

OALib Journal期刊
ISSN: 2333-9721
费用:99美元

查看量下载量

相关文章

更多...

1064nm激光对氧化铟锡薄膜的损伤研究

DOI: 10.11858/gywlxb.2012.01.016, PP. 107-112

Keywords: 激光辐照,液晶光学器件,损伤阈值,氧化铟锡薄膜

Full-Text   Cite this paper   Add to My Lib

Abstract:

液晶光学器件在激光光束精密控制上具有重要应用前景,氧化铟锡(ITO)薄膜作为液晶光学器件的透明导电电极,是液晶器件激光损伤的薄弱环节。为此,建立了ITO薄膜激光热损伤物理模型。理论计算结果表明:1064nm激光对ITO薄膜的损伤主要为热应力损伤;连续激光辐照下,薄膜损伤始于靠近界面的玻璃基底内;脉冲激光辐照下,温升主要发生在光斑范围内的膜层,薄膜损伤从表面开始。利用泵浦探测技术,研究了ITO薄膜的损伤情况,测量了不同功率密度激光辐照后薄膜的方块电阻,结合1-on-1法测定了ITO薄膜的50%损伤几率阈值。实验结果表明:薄膜越厚,方块电阻越小,激光损伤阈值越低;薄膜未完全损伤前,方块电阻随激光功率密度的增加而增大。理论计算与实验结果吻合较好。设计液晶光学器件中的ITO薄膜电极厚度时,应综合考虑激光损伤、透光率及薄膜电阻的影响。

References

[1]  Luo Y Q, Zhang D Y, Luo F, et al. Fabrication and research of liquid crystal λ/4 wave-plate at 1053 nm laser [J]. Applied Laser, 2009, 29(2): 136-138. (in Chinese)
[2]  骆永全, 张大勇, 罗飞, 等. 大口径近红外激光液晶波片研制 [J]. 应用激光, 2009, 29(2): 136-138.
[3]  Pawlewicz W T, Mann I B, Lowdermilk W H, et al. Laser-damage-resistant transparent conductive indium tin oxide coatings [J]. Appl Phys Lett, 1979, 34(3): 196-198.
[4]  Radhakrishnan P, Sathianandan K, Subhash N. Laser-induced damage to spray pyrolysis deposited transparent conducting films [J]. J Appl Phys, 1986, 59(3): 902-904.
[5]  Lunney J G, O'Neill R R, Schulmeister K. Excimer laser etching of transparent conducting oxides [J]. Appl Phys Lett, 1991, 59(6): 647-649.
[6]  Yavas O, Takai M. High-speed maskless laser patterning of indium tin oxide thin films [J]. Appl Phys Lett, 1998, 73(18): 2558-2560.
[7]  Cheng J Y, Yen M H, Hsu W C, et al. ITO patterning by a low power Q-switched green laser and its use in the fabrication of a transparent flow meter [J]. J Micromech Microeng, 2007, 17: 2316-2323.
[8]  Ye S L, Ma J S, Huang X, et al. Finite element simulation of thermal stress field in cutting LCD glass substrate by laser [J]. Applied Laser, 2006, 26(4): 267-271. (in Chinese)
[9]  叶圣麟, 马军山, 黄鑫, 等. 液晶显示玻璃基板激光切割热应力场的有限元仿真 [J]. 应用激光, 2006, 26(4): 267-271.
[10]  Yagi T, Tamano K, Sato Y, et al. Analysis on thermal properties of tin doped indium oxide films by picosecond thermoreflectance measurement [J]. J Vac Sci Technol A, 2005, 23(4): 1180-1186.
[11]  Szorenyi T, Laude L D, Bertóti I, et al. Excimer laser processing of indium-tin-oxide films: An optical investigation [J]. J Appl Phys, 1995, 78(10): 6211-6219.
[12]  Batzill M, Diebold U. The surface and materials science of tin oxide [J]. Prog Surf Sci, 2005, 79(2-4): 47-154.

Full-Text

Contact Us

service@oalib.com

QQ:3279437679

WhatsApp +8615387084133