全部 标题 作者
关键词 摘要

OALib Journal期刊
ISSN: 2333-9721
费用:99美元

查看量下载量

相关文章

更多...

集成电路动态老化测试系统中高速驱动板设计
Design of High-Speed Driving Board for Integrated Circuit of Burn-In Test System

DOI: 10.12677/OJCS.2014.34009, PP. 53-58

Keywords: 集成电路,动态老化,驱动板,现场可编程逻辑门阵列
Integrated Circuit
, Dynamic Burn-In, Driving Board, FPGA

Full-Text   Cite this paper   Add to My Lib

Abstract:

随着大规模集成电路生产技术的迅猛发展,多引脚封装的芯片、大容量的存储器及大规模嵌入式微处理器的广泛应用,国内现有的集成电路动态老化测试系统已不能满足需求。该文针对FPGA/CPLD集成度高、设计灵活等优点,设计并实现了一种应用于新一代动态老化系统的高速驱动板系统。该系统以Altera公司的MAXII系列CPLD芯片EPM570T144I5N为核心。通过FPGA/CPLD软硬件平台验证,该系统各个模块均工作正常,并能满足驱动能力的需求。
With the rapid development of production technology for large-scale integrated circuits, applica-tions of multi-pin package chip, large capacity memory and large scale of embedded microprocessor are more and more widely used. Domestic integrated circuit of dynamic burn-in system has been unable to meet the demand. In this paper, taking advantages of FPGA/CPLD high integration, flexible design, etc., it designs and implements high-speed driving board system applied in a new generation of dynamic burn-in system. The system takes the EPM570T144I5N of MAXII series chip in Altera Company as the core. Through the verification of FPGA/CPLD hardware platform, each module of the system works normally and can meet the requirements of driving ability.

References

[1]  冉立新 (2003) 大规模集成电路高温动态老化测试嵌入式图形发生系统的可编程ASIC实现. 仪器仪表学报, 24, 27-27.
[2]  温平平, 焦慧芳, 贾新章等 (2004) VLSI老化筛选试验技术的挑战. 电子产品可靠性与环境验, 5, 22-23.
[3]  马进峰, 张福洪, 石学诚 (2013) 集成电路高温动态老化系统硬件研制. 电子制作, 11, 226-226.
[4]  贾伟, 邵左文, 张玉猛等 (2007) 基于SPI总线的高速串行数据采集系统设计. 研发与开发, 4, 37-37.
[5]  石学诚 (2014) 新型存储器老化测试系统的实现. 杭州电子科技大学, 杭州, 32-35.

Full-Text

Contact Us

service@oalib.com

QQ:3279437679

WhatsApp +8615387084133