%0 Journal Article
%T 集成电路动态老化测试系统中高速驱动板设计
Design of High-Speed Driving Board for Integrated Circuit of Burn-In Test System
%A 曾榕
%A 张福洪
%A 楼津甫
%J Open Journal of Circuits and Systems
%P 53-58
%@ 2327-0861
%D 2014
%I Hans Publishing
%R 10.12677/OJCS.2014.34009
%X
随着大规模集成电路生产技术的迅猛发展,多引脚封装的芯片、大容量的存储器及大规模嵌入式微处理器的广泛应用,国内现有的集成电路动态老化测试系统已不能满足需求。该文针对FPGA/CPLD集成度高、设计灵活等优点,设计并实现了一种应用于新一代动态老化系统的高速驱动板系统。该系统以Altera公司的MAXII系列CPLD芯片EPM570T144I5N为核心。通过FPGA/CPLD软硬件平台验证,该系统各个模块均工作正常,并能满足驱动能力的需求。<br/>With the rapid development of production technology for large-scale integrated circuits, applica-tions of multi-pin package chip, large capacity memory and large scale of embedded microprocessor are more and more widely used. Domestic integrated circuit of dynamic burn-in system has been unable to meet the demand. In this paper, taking advantages of FPGA/CPLD high integration, flexible design, etc., it designs and implements high-speed driving board system applied in a new generation of dynamic burn-in system. The system takes the EPM570T144I5N of MAXII series chip in Altera Company as the core. Through the verification of FPGA/CPLD hardware platform, each module of the system works normally and can meet the requirements of driving ability.
%K 集成电路,动态老化,驱动板,现场可编程逻辑门阵列
Integrated Circuit
%K Dynamic Burn-In
%K Driving Board
%K FPGA
%U http://www.hanspub.org/journal/PaperInformation.aspx?PaperID=14530