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AIP Advances  2013 

Formation of Si or Ge nanodots in Si3N4 with in-situ donor modulation doping of adjacent barrier material

DOI: 10.1063/1.4789397

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Abstract:

Conventional doping of small nanodots does not provide majority carriers due to self-purification effects and much increased ionisation energies of dopants presenting point defects. Adjacent barrier layers to Si-rich Si3N4 can be doped by excess Si in-situ with the segregation anneal for Si nanodot formation. Donor doping of AlxGa1 xN (0 x 1) with Si is an established process. Material properties and process compatibility of AlxGa1 xN render it suitable as barrier for Si nanodot superlattices. Ab-initio calculations showed that Ge also works as a donor in AlN, extending the material range to Ge and SiGe nanodots in Si3N4.

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