Processing method for high resolution refraction seismic data and its application
高分辨折射地震资料处理方法及其应用

High resolution refraction profiles have been used more and more widely in some major basic geoscience research projects,especially the fine complex upper crust structure studies for urban active fault survey which has been gone on in CEA (China Earthquake Administration) during the Tenth Five Plan' of our country.In this paper,both the defects with traditional finite difference method to process the seismic data obtained from high resolution refraction profiles and the progress for their improving are discussed quite completely.The settling schemes for some defects,which have been successfully used to process and analyze the real seismic data from high resolution refraction profiles,are proposed and good results are achieved.Also,an applied example is given of processing and interpretation for first arrivals from a deep reflecting profile.Based on the studying and investigating from the domestic and abroad in this field,the settling schemes for other defects are under way at present.