%0 Journal Article
%T Processing method for high resolution refraction seismic data and its application<br>高分辨折射地震资料处理方法及其应用
%A XU Zhao-fan
%A ZHANG Xian-kang
%A LIU Bao-jing
%A FENG Shao-ying
%A HU Xiu-qi
%A <br>徐朝繁
%A 
%A 张先康
%A 刘宝金
%A 酆少英
%A 胡修奇
%J 地球物理学进展
%D 2005
%I 
%X High resolution refraction profiles have been used more and more widely in some major basic geoscience research projects,especially the fine complex upper crust structure studies for urban active fault survey which has been gone on in CEA (China Earthquake Administration) during the Tenth Five Plan' of our country.In this paper,both the defects with traditional finite difference method to process the seismic data obtained from high resolution refraction profiles and the progress for their improving are discussed quite completely.The settling schemes for some defects,which have been successfully used to process and analyze the real seismic data from high resolution refraction profiles,are proposed and good results are achieved.Also,an applied example is given of processing and interpretation for first arrivals from a deep reflecting profile.Based on the studying and investigating from the domestic and abroad in this field,the settling schemes for other defects are under way at present.
%K high resolution refraction profile
%K upper crust structure
%K urban active fault survey
%K first arrivals of deepseismic reflection<br>高分辨折射剖面
%K 上部地壳结构
%K 城市活断层探测
%K 深反射初至波
%U http://www.alljournals.cn/get_abstract_url.aspx?pcid=E62459D214FD64A3C8082E4ED1ABABED5711027BBBDDD35B&cid=1E44AE713D8A6DE0&jid=65CE641AB2DEAAF8B2D39ECB6B6B6C80&aid=EAA2805A94213216&yid=2DD7160C83D0ACED&vid=A04140E723CB732E&iid=E158A972A605785F&sid=33C2C2DAF31F219B&eid=10343777FBBF55D5&journal_id=1004-2903&journal_name=地球物理学进展&referenced_num=11&reference_num=27