Test data compression scheme according to scan disabling structure
针对扫描阻塞结构的测试数据压缩方案*

This paper first analyzed some problems for integrated circuit(IC) testing such as large size of test data and long time of test application,introduced some test compression method,then proposed a coding compression scheme for parts of data based on the scan disabling test structure.The coding method can compress test data by few additional hardware.Theoretical analysis and experimental results show that the proposed scheme is feasible and efficient.