%0 Journal Article
%T Test data compression scheme according to scan disabling structure<br>针对扫描阻塞结构的测试数据压缩方案*
%A CAI Shuo
%A YANG Zhi-yuan
%A LIU Tie-qiao
%A WANG Wei-zheng
%A <br>蔡烁
%A 杨致远
%A 刘铁桥
%A 王伟征
%J 计算机应用研究
%D 2012
%I 
%X This paper first analyzed some problems for integrated circuit(IC) testing such as large size of test data and long time of test application,introduced some test compression method,then proposed a coding compression scheme for parts of data based on the scan disabling test structure.The coding method can compress test data by few additional hardware.Theoretical analysis and experimental results show that the proposed scheme is feasible and efficient.
%K scan disabling structure
%K care bits
%K test slice
%K Poisson distribution
%K coding compression<br>扫描阻塞结构
%K 确定位
%K 测试片段
%K 泊松分布
%K 编码压缩
%U http://www.alljournals.cn/get_abstract_url.aspx?pcid=5B3AB970F71A803DEACDC0559115BFCF0A068CD97DD29835&cid=8240383F08CE46C8B05036380D75B607&jid=A9D9BE08CDC44144BE8B5685705D3AED&aid=DD72437537278C17EE3788744B103518&yid=99E9153A83D4CB11&vid=771469D9D58C34FF&iid=E158A972A605785F&sid=9129323FE7AA9847&eid=41685CA5511D97F7&journal_id=1001-3695&journal_name=计算机应用研究&referenced_num=0&reference_num=13