Optimal strategy of test point selection for circuit based on information entropy
基于信息熵的电路测点优化策略

Directed towards the test point selection problem for circuit, researched the dependency matrix and information entropy theory. This paper presented an optimal strategy of test point selection for circuit based on information entropy after the improving of dependency matrix, and gave the detailed process of calculation. The application example shows that the method is feasible, and it can be applied to fault diagnosis and design for testability of analog, digital and mixed circuit.