%0 Journal Article
%T Optimal strategy of test point selection for circuit based on information entropy<br>基于信息熵的电路测点优化策略
%A HUANG Yi-feng
%A JING Bo
%A XIA Yan
%A <br>黄以锋
%A 景博
%A 夏岩
%J 计算机应用研究
%D 2010
%I 
%X Directed towards the test point selection problem for circuit, researched the dependency matrix and information entropy theory. This paper presented an optimal strategy of test point selection for circuit based on information entropy after the improving of dependency matrix, and gave the detailed process of calculation. The application example shows that the method is feasible, and it can be applied to fault diagnosis and design for testability of analog, digital and mixed circuit.
%K fault diagnosis
%K design for testability
%K information entropy
%K test point selection<br>故障诊断
%K 可测试性设计
%K 信息熵
%K 测点选择
%U http://www.alljournals.cn/get_abstract_url.aspx?pcid=5B3AB970F71A803DEACDC0559115BFCF0A068CD97DD29835&cid=8240383F08CE46C8B05036380D75B607&jid=A9D9BE08CDC44144BE8B5685705D3AED&aid=A5B1A5A8EABFFACF3A1871EE0FBFFE4B&yid=140ECF96957D60B2&vid=DB817633AA4F79B9&iid=708DD6B15D2464E8&sid=952ED79F7B397FF1&eid=6C2EBACCB14BF1EF&journal_id=1001-3695&journal_name=计算机应用研究&referenced_num=0&reference_num=19