CombinationalcircuittestgenerationmethodbasedonBDDandBooleandifference
基于BDD和布尔差分的组合电路测试生成方法*

The method came from the notion of Boolean difference,it generated tests for CUT by judging the structure of circuit function's BDD.In comparison with traditional ATPG using diagram searching,the method could efficiently reduce time and space cost in operation and brought the academic Boolean difference into practice.The results of experiments show that the method is an effective way for test generation.