%0 Journal Article
%T CombinationalcircuittestgenerationmethodbasedonBDDandBooleandifference<br>基于BDD和布尔差分的组合电路测试生成方法*
%A OUYANG Yi-ming
%A MOU Yi
%A LIANG Hua-guo
%A <br>欧阳一鸣
%A 牟屹
%A 梁华国
%J 计算机应用研究
%D 2008
%I 
%X The method came from the notion of Boolean difference,it generated tests for CUT by judging the structure of circuit function's BDD.In comparison with traditional ATPG using diagram searching,the method could efficiently reduce time and space cost in operation and brought the academic Boolean difference into practice.The results of experiments show that the method is an effective way for test generation.
%K binary decision diagram(BDD)
%K Boolean difference
%K automatic test pattern generation(ATPG)<br>二元决策图
%K 布尔差分
%K 自动测试向量生成
%U http://www.alljournals.cn/get_abstract_url.aspx?pcid=5B3AB970F71A803DEACDC0559115BFCF0A068CD97DD29835&cid=8240383F08CE46C8B05036380D75B607&jid=A9D9BE08CDC44144BE8B5685705D3AED&aid=E6DE3A0047709996675EC71B6FCEE649&yid=67289AFF6305E306&vid=C5154311167311FE&iid=94C357A881DFC066&sid=CFB9125E4BCA3130&eid=193F3A809807D248&journal_id=1001-3695&journal_name=计算机应用研究&referenced_num=0&reference_num=12