Methods for Enhancing ATPG Efficiency of Dynamic Current Testing
提高瞬态电流自动测试生成时间效率的方法*

Dynamic current testing can detect some faults that cannot be detected by voltage based test method and quiescent current test method. It takes too much of time to generate a test pattern for each fault, and it is not necessary. This paper focuses on how to reduce the number of stuck-open fauhs detected by dynamic current test technique for enhancing the ATPG efficiency. This can be done in the way that nearer the site of a fault to the primary outputs of the circuit under test, earlier the ATPG for this fault starts. Experimental results show that about 70% of ATPG time is cut down.