%0 Journal Article
%T Methods for Enhancing ATPG Efficiency of Dynamic Current Testing<br>提高瞬态电流自动测试生成时间效率的方法*
%A ZHANG Xin
%A KUANG Ji-shun
%A <br>张鑫
%A 邝继顺
%J 计算机应用研究
%D 2006
%I 
%X Dynamic current testing can detect some faults that cannot be detected by voltage based test method and quiescent current test method. It takes too much of time to generate a test pattern for each fault, and it is not necessary. This paper focuses on how to reduce the number of stuck-open fauhs detected by dynamic current test technique for enhancing the ATPG efficiency. This can be done in the way that nearer the site of a fault to the primary outputs of the circuit under test, earlier the ATPG for this fault starts. Experimental results show that about 70% of ATPG time is cut down.
%K ATPG
%K Stuck-open Fault
%K Controllability
%K CMOS Circuit<br>测试生成
%K 开路故障
%K 可控制性
%K CMOS数字电路
%U http://www.alljournals.cn/get_abstract_url.aspx?pcid=5B3AB970F71A803DEACDC0559115BFCF0A068CD97DD29835&cid=8240383F08CE46C8B05036380D75B607&jid=A9D9BE08CDC44144BE8B5685705D3AED&aid=81F46FCBA3894F2C&yid=37904DC365DD7266&vid=EA389574707BDED3&iid=B31275AF3241DB2D&sid=0D0D661F0B316AD5&eid=656F8C8401D91023&journal_id=1001-3695&journal_name=计算机应用研究&referenced_num=0&reference_num=16