STRUCTURAL AND OPTICAL PROPERTIES OF Bi4-xLaxTi3O12 THIN FILMS
Bi4-xLaxTi3O12铁电薄膜结构和光学性能研究

Lanthanum-substituted bismuth titanate(BLT) thin films were deposited on Si(100) substrates and on quartz substrates by using the chemical solution deposition method. The crystallinity of BLT thin films was examined by X-ray diffraction (XRD). X-ray diffraction analyses show that the BLT thin films are polycrystalline and the crystalline quality of the films is improved with the increasing of annealing temperature. The optical properties of the BLT thin films were investigated by using a spectroscopic ellipsometry. The optical constant spectra (refractive index n and the extinction coefficient k) of the BLT thin films were obtained. Laser micro-Raman spectrometer was used to study the lattice vibration modes of the BLT thin films deposited on quartz substrates.