%0 Journal Article
%T STRUCTURAL AND OPTICAL PROPERTIES OF Bi4-xLaxTi3O12 THIN FILMS<br>Bi4-xLaxTi3O12铁电薄膜结构和光学性能研究
%A DU Feng-Juan
%A LIU Yi
%A TAO Ke-Yu
%A YANG Sheng-Hong
%A ZHANG Yue-Li
%A <br>杜凤娟
%A 刘毅
%A 陶科玉
%A 阳生红
%A 张曰理
%J 红外与毫米波学报
%D 2007
%I Science Press
%X Lanthanum-substituted bismuth titanate(BLT) thin films were deposited on Si(100) substrates and on quartz substrates by using the chemical solution deposition method. The crystallinity of BLT thin films was examined by X-ray diffraction (XRD). X-ray diffraction analyses show that the BLT thin films are polycrystalline and the crystalline quality of the films is improved with the increasing of annealing temperature. The optical properties of the BLT thin films were investigated by using a spectroscopic ellipsometry. The optical constant spectra (refractive index n and the extinction coefficient k) of the BLT thin films were obtained. Laser micro-Raman spectrometer was used to study the lattice vibration modes of the BLT thin films deposited on quartz substrates.
%K ferroelectric films
%K spectroscopic ellipsometry
%K Raman spectroscopy
%K bismuth lanthanum titanate thin film<br>铁电薄膜
%K 椭偏光谱
%K 拉曼光谱
%K BLT薄膜
%U http://www.alljournals.cn/get_abstract_url.aspx?pcid=5B3AB970F71A803DEACDC0559115BFCF0A068CD97DD29835&cid=1319827C0C74AAE8D654BEA21B7F54D3&jid=D3B4F771D1A06062008B4D0A2EF05996&aid=46A6A5F084F519E6&yid=A732AF04DDA03BB3&vid=96C778EE049EE47D&iid=94C357A881DFC066&sid=2E01F39B6CBD53DE&eid=B66C5792F4740920&journal_id=1001-9014&journal_name=红外与毫米波学报&referenced_num=0&reference_num=9