THE STUDY OF POLY (TETRAPHENYLPHENYL) METHYLSI- LANE, POLYVINYLMETHYLSILANE AND THEIR COPO- LYMER BY MEANS OF X-RAY PHOTOELECTRON SPECTROSCOPY (XPS)
四苯(基)苯基聚硅烷、乙烯基聚硅烷以及二者共聚物的XPS研究

Poly (tetraphenylphenyl) methylsilane, polyvinylmethylsilane and their copolymer were investigated by means of X-ray photoelectron spectroscopy (XPS). Existences of (P-P)x,(P-d)x and (d-d)x in polysilanes could be characterized by XPS shake-up satellite peaks of C1s and Si2p. The order of ionization. potentials of various polysilanes have been also given by their XPS valence band spectra in this paper.