%0 Journal Article
%T THE STUDY OF POLY (TETRAPHENYLPHENYL) METHYLSI- LANE, POLYVINYLMETHYLSILANE AND THEIR COPO- LYMER BY MEANS OF X-RAY PHOTOELECTRON SPECTROSCOPY (XPS)<br>四苯(基)苯基聚硅烷、乙烯基聚硅烷以及二者共聚物的XPS研究
%A DU Zuo-dong
%A CHEN Jian-hua
%A FENG Sheng-yu
%A WANG Dian-xun
%A <br>杜作栋
%A 陈剑华
%A 冯圣玉
%A 王殿勋
%J 高分子学报
%D 1989
%I 
%X Poly (tetraphenylphenyl) methylsilane, polyvinylmethylsilane and their copolymer were investigated by means of X-ray photoelectron spectroscopy (XPS). Existences of (P-P)x,(P-d)x and (d-d)x in polysilanes could be characterized by XPS shake-up satellite peaks of C1s and Si2p. The order of ionization. potentials of various polysilanes have been also given by their XPS valence band spectra in this paper.
%K Polysilane
%K XPS satellite peak
%K XPS valence band spectra<br>聚硅烷
%K XPS伴峰
%K XPS价带谱
%U http://www.alljournals.cn/get_abstract_url.aspx?pcid=6E709DC38FA1D09A4B578DD0906875B5B44D4D294832BB8E&cid=6579068328FE643F&jid=15971983683C7643EE80F1CE621DEB60&aid=57FA7B04376093AF3052647B29529A8A&yid=1833A6AA51F779C1&iid=CA4FD0336C81A37A&sid=ECE8E54D6034F642&eid=94E7F66E6C42FA23&journal_id=1000-3304&journal_name=高分子学报&referenced_num=0&reference_num=5