A HREM IMAGE ANALYSIS FOR GEOMETRICAL MISMATCH AT INTERFACES
两相界面几何错配的高分辨电子显微象分析

The normal interface analysis procedure is that to calculate the mismatch between two sets of lattice planes of the two corresponding matrix phases based upon the lattice parameters, then to compare the rseult with the observed interface dislocation arrangement. This work investigates the cases where misfit dislocations should exist at the interface according to prediction from geometrical mismatch analysis, however, very good coherent match at such interface in fact appears in the observed high resolution electron microscopy (HREM) images. The fact implies that the structural similarity between two phases can accommodate a rather large geometrical mismatch at the interface.