%0 Journal Article
%T A HREM IMAGE ANALYSIS FOR GEOMETRICAL MISMATCH AT INTERFACES<br>两相界面几何错配的高分辨电子显微象分析
%A YE Hengqiang
%A <br>叶恒强
%J 腐蚀科学与防护技术
%D 1993
%I 
%X The normal interface analysis procedure is that to calculate the mismatch between two sets of lattice planes of the two corresponding matrix phases based upon the lattice parameters, then to compare the rseult with the observed interface dislocation arrangement. This work investigates the cases where misfit dislocations should exist at the interface according to prediction from geometrical mismatch analysis, however, very good coherent match at such interface in fact appears in the observed high resolution electron microscopy (HREM) images. The fact implies that the structural similarity between two phases can accommodate a rather large geometrical mismatch at the interface.
%K interface
%K geometrical mismatch
%K HREM<br>界面
%K 几何错配
%K 电子显微术
%U http://www.alljournals.cn/get_abstract_url.aspx?pcid=5B3AB970F71A803DEACDC0559115BFCF0A068CD97DD29835&cid=AB188D3B70B071C57EB64E395D864ECE&jid=9F6E6EC8BA5BB62698F6640073DDD6E1&aid=C8180846F1B0423D&yid=D418FDC97F7C2EBA&vid=94C357A881DFC066&iid=CA4FD0336C81A37A&sid=F3090AE9B60B7ED1&eid=F3583C8E78166B9E&journal_id=1002-6495&journal_name=腐蚀科学与防护技术&referenced_num=0&reference_num=5