Test Generation of Sequential Circuits Based on Ant Algorithm and Genetic Algorithm
基于蚂蚁算法和遗传算法的时序电路测试生成

This paper presents a new test pattern generation technique based on ant algorithm and genetic algorithm for improving the test generation efficiency for sequential circuits. Experimental results for the sequential benchmark circuits show that the hybrid approach not only takes full advantage of utilizing both algoritmus, but also overcomes their disadvantages. It can achieve higher fault coverages and more compact test sets when compared to other similar test generation algorithms, demonstrating the combined algorithm is a successful algorithm.