%0 Journal Article
%T Test Generation of Sequential Circuits Based on Ant Algorithm and Genetic Algorithm<br>基于蚂蚁算法和遗传算法的时序电路测试生成
%A Xu Chuan-pei
%A Li Zhi
%A Mo Wei
%A <br>许川佩
%A 李智
%A 莫玮
%J 电子与信息学报
%D 2005
%I 
%X This paper presents a new test pattern generation technique based on ant algorithm and genetic algorithm for improving the test generation efficiency for sequential circuits. Experimental results for the sequential benchmark circuits show that the hybrid approach not only takes full advantage of utilizing both algoritmus, but also overcomes their disadvantages. It can achieve higher fault coverages and more compact test sets when compared to other similar test generation algorithms, demonstrating the combined algorithm is a successful algorithm.
%K Sequential circuit
%K Test generation
%K Ant algorithm
%K Genetic algorithm<br>时序电路
%K 测试生成
%K 蚂蚁算法
%K 遗传算法
%U http://www.alljournals.cn/get_abstract_url.aspx?pcid=5B3AB970F71A803DEACDC0559115BFCF0A068CD97DD29835&cid=1319827C0C74AAE8D654BEA21B7F54D3&jid=EFC0377B03BD8D0EF4BBB548AC5F739A&aid=BB0352BECFB2B272&yid=2DD7160C83D0ACED&vid=DB817633AA4F79B9&iid=DF92D298D3FF1E6E&sid=CD1AB74EAF0667FF&eid=ADA74056AD01F4A8&journal_id=1009-5896&journal_name=电子与信息学报&referenced_num=3&reference_num=8