STUDY OF THE SURFACE STRUCTURE OF LEAD SILICATE GLASS REDUCED BY HYDROGEN
氢还原铅硅酸盐玻璃表面层结构的研究

The XPS, AES and EP have been used to study the elemental depth-distributions of secondary eletron emission layer of lead silicate glass reduced by hydrogen. The samples treated at different temperatures have differences in their micro-structures. The effects of different reduced temperature have been discussed, and new model of the layer of secondary electron emitter has been suggested