%0 Journal Article
%T STUDY OF THE SURFACE STRUCTURE OF LEAD SILICATE GLASS REDUCED BY HYDROGEN<br>氢还原铅硅酸盐玻璃表面层结构的研究
%A Wei Yayi
%A <br>韦亚一
%J 电子与信息学报
%D 1992
%I 
%X The XPS, AES and EP have been used to study the elemental depth-distributions of secondary eletron emission layer of lead silicate glass reduced by hydrogen. The samples treated at different temperatures have differences in their micro-structures. The effects of different reduced temperature have been discussed, and new model of the layer of secondary electron emitter has been suggested
%K Micro-channel plate( MCP)
%K XPS (X-ray Photoelectron-Spectroscopy)
%K AES (Auger Electron Spectroscopy)
%K Hydrogen reduction
%K Depth-distribution of elements
%K Secondary electron emitter<br>微通道板
%K XPS(X光电子能谱)
%K AES(Auger电子能谱)
%K 烧氢还原
%K 元素深度分布
%K 次级电子发射体
%U http://www.alljournals.cn/get_abstract_url.aspx?pcid=5B3AB970F71A803DEACDC0559115BFCF0A068CD97DD29835&cid=1319827C0C74AAE8D654BEA21B7F54D3&jid=EFC0377B03BD8D0EF4BBB548AC5F739A&aid=34C9D66FEAE57590&yid=F53A2717BDB04D52&vid=F3583C8E78166B9E&iid=B31275AF3241DB2D&sid=8DDBA6455F2E3ECF&eid=D559883475316B44&journal_id=1009-5896&journal_name=电子与信息学报&referenced_num=0&reference_num=8