APPLICATION OF ULTRA-HIGH SPEED WAVEFORM DIGITIZED SYSTEM TO IC BASED ON LASER PROBE
基于光探针的超高速波形数字化测试系统的应用

This paper introduces the construction of the ultra-high speed waveform digitized system based on laser probe. The functions of different stages of the high-speed dynamic divider circuit chip are measured with the double-frequency phase sweeping technique. A detail analysis about the chip failure and the characteristics of laser probe measurement is given.