%0 Journal Article
%T APPLICATION OF ULTRA-HIGH SPEED WAVEFORM DIGITIZED SYSTEM TO IC BASED ON LASER PROBE<br>基于光探针的超高速波形数字化测试系统的应用
%A Tian Xiaojian Zhang Darning Gao Yanjun Li Dehui Yi Maobin
%A <br>田小建
%A 张大明
%A 高艳君
%A 李德辉
%A 衣茂斌
%J 电子与信息学报
%D 2000
%I 
%X This paper introduces the construction of the ultra-high speed waveform digitized system based on laser probe. The functions of different stages of the high-speed dynamic divider circuit chip are measured with the double-frequency phase sweeping technique. A detail analysis about the chip failure and the characteristics of laser probe measurement is given.
%K Laser probe
%K Electrooptic sampling
%K Integrated circuit chip<br>光探针
%K 电光采佯
%K 集成电路芯片
%U http://www.alljournals.cn/get_abstract_url.aspx?pcid=5B3AB970F71A803DEACDC0559115BFCF0A068CD97DD29835&cid=1319827C0C74AAE8D654BEA21B7F54D3&jid=EFC0377B03BD8D0EF4BBB548AC5F739A&aid=58A372107F67C8D9&yid=9806D0D4EAA9BED3&vid=BC12EA701C895178&iid=0B39A22176CE99FB&sid=C7DDDE86E6286CD9&eid=31125890FF093250&journal_id=1009-5896&journal_name=电子与信息学报&referenced_num=0&reference_num=4