USING THE GENETIC ALGORITHMS TO SOLVE THE PROBLEM OF OPTIMAL SPARE ALLOCATION FOR FAULT-TOLERANT VLSI
VLSI冗余单元最优分配的遗传算法求解

An increase in chip area and circuit complexity leads to a reduction in the yield of production. In order to solve the problem of low yield by defects in process of large scale integrated circuits manufacture, the fault-tolerant technique is introduced into the integrated circuits design. A system must be provided with a certain quantity of spare elements to have the ability of fault-tolerance. In this paper, the problem of optimal spare allocation for fault-tolerant VLSI is solved effectively by means of genetic algorithm.